Fundamentals of Organic Film Growth and Characterisation

Helmut Sitter, Roland Resel, Georg Koller, Michael G. Ramsey, Andrei Andreev, Christian Teichert

Research output: Chapter in Book/Report/Conference proceedingChapterResearch

Original languageEnglish
Title of host publicationOrganic Nanostructures for Next Generation Devices
Place of PublicationBerlin [u.a.]
PublisherSpringer
Pages3-19
Volume101
Edition1
ISBN (Print)978-3-540-71922-9
Publication statusPublished - 2008

Publication series

NameSpringer Series in Materials Science
PublisherSpringer

Cite this

Sitter, H., Resel, R., Koller, G., Ramsey, M. G., Andreev, A., & Teichert, C. (2008). Fundamentals of Organic Film Growth and Characterisation. In Organic Nanostructures for Next Generation Devices (1 ed., Vol. 101, pp. 3-19). (Springer Series in Materials Science). Berlin [u.a.]: Springer.

Fundamentals of Organic Film Growth and Characterisation. / Sitter, Helmut; Resel, Roland; Koller, Georg; Ramsey, Michael G.; Andreev, Andrei; Teichert, Christian.

Organic Nanostructures for Next Generation Devices. Vol. 101 1. ed. Berlin [u.a.] : Springer, 2008. p. 3-19 (Springer Series in Materials Science).

Research output: Chapter in Book/Report/Conference proceedingChapterResearch

Sitter, H, Resel, R, Koller, G, Ramsey, MG, Andreev, A & Teichert, C 2008, Fundamentals of Organic Film Growth and Characterisation. in Organic Nanostructures for Next Generation Devices. 1 edn, vol. 101, Springer Series in Materials Science, Springer, Berlin [u.a.], pp. 3-19.
Sitter H, Resel R, Koller G, Ramsey MG, Andreev A, Teichert C. Fundamentals of Organic Film Growth and Characterisation. In Organic Nanostructures for Next Generation Devices. 1 ed. Vol. 101. Berlin [u.a.]: Springer. 2008. p. 3-19. (Springer Series in Materials Science).
Sitter, Helmut ; Resel, Roland ; Koller, Georg ; Ramsey, Michael G. ; Andreev, Andrei ; Teichert, Christian. / Fundamentals of Organic Film Growth and Characterisation. Organic Nanostructures for Next Generation Devices. Vol. 101 1. ed. Berlin [u.a.] : Springer, 2008. pp. 3-19 (Springer Series in Materials Science).
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