Fundamentals of electron energy-loss spectroscopy

Ferdinand Hofer; Franz-Philipp Schmidt; Werner Grogger; Gerald Kothleitner

doi:10.1088/1757-899X/109/1/012007

Fundamentals of electron energy-loss spectroscopy

Ferdinand Hofer, Franz-Philipp Schmidt, Werner Grogger, Gerald Kothleitner

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to journal › Article › peer-review

Abstract

Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution. This review provides an overview of the physical basis and new developments and applications of EELS in scanning transmission electron microscopy. Recent advances in elemental mapping, spectrum imaging of plasmonic structures and quantitative analysis of atomically resolved elemental maps are highlighted.

Original language	English
Article number	012007
Pages (from-to)	1-9
Number of pages	9
Journal	IOP Conference Series: Materials Science and Engineering
Volume	109
DOIs	https://doi.org/10.1088/1757-899X/109/1/012007
Publication status	Published - 2016

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Access to Document

10.1088/1757-899X/109/1/012007

Cite this

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title = "Fundamentals of electron energy-loss spectroscopy",

abstract = "Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution. This review provides an overview of the physical basis and new developments and applications of EELS in scanning transmission electron microscopy. Recent advances in elemental mapping, spectrum imaging of plasmonic structures and quantitative analysis of atomically resolved elemental maps are highlighted.",

author = "Ferdinand Hofer and Franz-Philipp Schmidt and Werner Grogger and Gerald Kothleitner",

note = "Emas 2015, 14th European Workshop on Modern Development and Applications in Microbeam Analysis",

year = "2016",

doi = "10.1088/1757-899X/109/1/012007",

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AU - Schmidt, Franz-Philipp

AU - Grogger, Werner

AU - Kothleitner, Gerald

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PY - 2016

Y1 - 2016

N2 - Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution. This review provides an overview of the physical basis and new developments and applications of EELS in scanning transmission electron microscopy. Recent advances in elemental mapping, spectrum imaging of plasmonic structures and quantitative analysis of atomically resolved elemental maps are highlighted.

AB - Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution. This review provides an overview of the physical basis and new developments and applications of EELS in scanning transmission electron microscopy. Recent advances in elemental mapping, spectrum imaging of plasmonic structures and quantitative analysis of atomically resolved elemental maps are highlighted.

U2 - 10.1088/1757-899X/109/1/012007

DO - 10.1088/1757-899X/109/1/012007

M3 - Article

SN - 1757-8981

VL - 109

SP - 1

EP - 9

JO - IOP Conference Series: Materials Science and Engineering

JF - IOP Conference Series: Materials Science and Engineering

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ER -

Fundamentals of electron energy-loss spectroscopy

Abstract

Fields of Expertise

Treatment code (Nähere Zuordnung)

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