Fundamentals of electron energy-loss spectroscopy

Research output: Contribution to journalArticleResearchpeer-review

Abstract

Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution. This review provides an overview of the physical basis and new developments and applications of EELS in scanning transmission electron microscopy. Recent advances in elemental mapping, spectrum imaging of plasmonic structures and quantitative analysis of atomically resolved elemental maps are highlighted.
Original languageEnglish
Article number012007
Pages (from-to)1-9
Number of pages9
JournalIOP Conference Series / Materials Science and Engineering
Volume109
DOIs
Publication statusPublished - 2016

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Electron energy loss spectroscopy
Inelastic scattering
Electron microscopes
Transmission electron microscopy
Imaging techniques
Scanning electron microscopy
Electrons
Chemical analysis

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Fundamentals of electron energy-loss spectroscopy. / Hofer, Ferdinand; Schmidt, Franz-Philipp; Grogger, Werner; Kothleitner, Gerald.

In: IOP Conference Series / Materials Science and Engineering, Vol. 109, 012007, 2016, p. 1-9.

Research output: Contribution to journalArticleResearchpeer-review

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