Functional Verification of Future Higher Class UHF RFID Architectures based on Cosimulation

Alex Janek, Christian Steger, Reinhold Weiß, Josef Preishuber-Pfluegl, Markus Pistauer

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationIEEE International Conference on RFID 2008 - Proceedings
Publisher.
Publication statusAccepted/In press - 2008
EventIEEE International Conference on RFID - Las Vegas, Nevada, United States
Duration: 16 Apr 200817 Apr 2008

Conference

ConferenceIEEE International Conference on RFID
CountryUnited States
CityLas Vegas, Nevada
Period16/04/0817/04/08

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Janek, A., Steger, C., Weiß, R., Preishuber-Pfluegl, J., & Pistauer, M. (Accepted/In press). Functional Verification of Future Higher Class UHF RFID Architectures based on Cosimulation. In IEEE International Conference on RFID 2008 - Proceedings ..

Functional Verification of Future Higher Class UHF RFID Architectures based on Cosimulation. / Janek, Alex; Steger, Christian; Weiß, Reinhold; Preishuber-Pfluegl, Josef; Pistauer, Markus.

IEEE International Conference on RFID 2008 - Proceedings. ., 2008.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Janek, A, Steger, C, Weiß, R, Preishuber-Pfluegl, J & Pistauer, M 2008, Functional Verification of Future Higher Class UHF RFID Architectures based on Cosimulation. in IEEE International Conference on RFID 2008 - Proceedings. ., IEEE International Conference on RFID, Las Vegas, Nevada, United States, 16/04/08.
Janek A, Steger C, Weiß R, Preishuber-Pfluegl J, Pistauer M. Functional Verification of Future Higher Class UHF RFID Architectures based on Cosimulation. In IEEE International Conference on RFID 2008 - Proceedings. . 2008
Janek, Alex ; Steger, Christian ; Weiß, Reinhold ; Preishuber-Pfluegl, Josef ; Pistauer, Markus. / Functional Verification of Future Higher Class UHF RFID Architectures based on Cosimulation. IEEE International Conference on RFID 2008 - Proceedings. ., 2008.
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