Full X-ray pattern analysis of vacuum deposited pentacene thin films

Oliver Werzer, B. Stadlober, A. Haase, M. Oehzelt, Roland Resel

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)455-459
JournalThe European physical journal / B
Volume66
Issue number4
DOIs
Publication statusPublished - 2008

Cite this