Full characterization of localized surface plasmons on a silver

Franz Schmidt, Harald Ditlbacher, Ulrich Hohenester, Ferdinand Hofer, Joachim R. Krenn

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationPhysical Sciences: Applications
Publisher.
Pages67-68
VolumeVolume:1
ISBN (Print)978-0-9502463-5-2
Publication statusPublished - 2012
EventEuropean Microscopy Congress - Manchester
Duration: 16 Sep 201221 Sep 2012

Conference

ConferenceEuropean Microscopy Congress
CityManchester
Period16/09/1221/09/12

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Schmidt, F., Ditlbacher, H., Hohenester, U., Hofer, F., & Krenn, J. R. (2012). Full characterization of localized surface plasmons on a silver. In Physical Sciences: Applications (Vol. Volume:1, pp. 67-68). ..

Full characterization of localized surface plasmons on a silver. / Schmidt, Franz; Ditlbacher, Harald; Hohenester, Ulrich; Hofer, Ferdinand; Krenn, Joachim R.

Physical Sciences: Applications. Vol. Volume:1 ., 2012. p. 67-68.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Schmidt, F, Ditlbacher, H, Hohenester, U, Hofer, F & Krenn, JR 2012, Full characterization of localized surface plasmons on a silver. in Physical Sciences: Applications. vol. Volume:1, ., pp. 67-68, European Microscopy Congress, Manchester, 16/09/12.
Schmidt F, Ditlbacher H, Hohenester U, Hofer F, Krenn JR. Full characterization of localized surface plasmons on a silver. In Physical Sciences: Applications. Vol. Volume:1. . 2012. p. 67-68
Schmidt, Franz ; Ditlbacher, Harald ; Hohenester, Ulrich ; Hofer, Ferdinand ; Krenn, Joachim R. / Full characterization of localized surface plasmons on a silver. Physical Sciences: Applications. Vol. Volume:1 ., 2012. pp. 67-68
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