Fricition Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films

Quan Shen, Gregor Hlawacek, Christian Teichert, Alexandra Lex, Thomas Höfler, Gregor Trimmel, Wolfgang Kern

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2008
EventERMS 2008 Spring meeting - Strasbourg, Frankreich
Duration: 26 May 200830 May 2008

Conference

ConferenceERMS 2008 Spring meeting
CityStrasbourg, Frankreich
Period26/05/0830/05/08

Treatment code (Nähere Zuordnung)

  • Experimental

Cite this

Shen, Q., Hlawacek, G., Teichert, C., Lex, A., Höfler, T., Trimmel, G., & Kern, W. (2008). Fricition Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films. Poster session presented at ERMS 2008 Spring meeting, Strasbourg, Frankreich, .

Fricition Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films. / Shen, Quan; Hlawacek, Gregor; Teichert, Christian; Lex, Alexandra; Höfler, Thomas; Trimmel, Gregor; Kern, Wolfgang.

2008. Poster session presented at ERMS 2008 Spring meeting, Strasbourg, Frankreich, .

Research output: Contribution to conferencePosterResearch

Shen, Q, Hlawacek, G, Teichert, C, Lex, A, Höfler, T, Trimmel, G & Kern, W 2008, 'Fricition Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films' ERMS 2008 Spring meeting, Strasbourg, Frankreich, 26/05/08 - 30/05/08, .
Shen Q, Hlawacek G, Teichert C, Lex A, Höfler T, Trimmel G et al. Fricition Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films. 2008. Poster session presented at ERMS 2008 Spring meeting, Strasbourg, Frankreich, .
Shen, Quan ; Hlawacek, Gregor ; Teichert, Christian ; Lex, Alexandra ; Höfler, Thomas ; Trimmel, Gregor ; Kern, Wolfgang. / Fricition Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films. Poster session presented at ERMS 2008 Spring meeting, Strasbourg, Frankreich, .
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title = "Fricition Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films",
author = "Quan Shen and Gregor Hlawacek and Christian Teichert and Alexandra Lex and Thomas H{\"o}fler and Gregor Trimmel and Wolfgang Kern",
year = "2008",
language = "English",
note = "ERMS 2008 Spring meeting ; Conference date: 26-05-2008 Through 30-05-2008",

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TY - CONF

T1 - Fricition Force Imaging of Chemical Differences in Patterned, Photosensitive Ultrathin Films

AU - Shen, Quan

AU - Hlawacek, Gregor

AU - Teichert, Christian

AU - Lex, Alexandra

AU - Höfler, Thomas

AU - Trimmel, Gregor

AU - Kern, Wolfgang

PY - 2008

Y1 - 2008

UR - http://www.emrs-strasbourg.com

M3 - Poster

ER -