Focused ion beam processing of low melting polymers: new perspectives due to optimized patterning strategies

Roland Schmied, Angelina Orthacker, Boril Stefanov Chernev, Gregor Trimmel, Harald Plank

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInstrumentation and Methods; Materials Science
Publisher.
Pages359-360
Publication statusPublished - 2013
EventMicroscopy Conference - Regensburg, Germany
Duration: 25 Aug 201330 Aug 2013

Conference

ConferenceMicroscopy Conference
Abbreviated titleMC
CountryGermany
CityRegensburg
Period25/08/1330/08/13

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Schmied, R., Orthacker, A., Chernev, B. S., Trimmel, G., & Plank, H. (2013). Focused ion beam processing of low melting polymers: new perspectives due to optimized patterning strategies. In Instrumentation and Methods; Materials Science (pp. 359-360). ..