Focused Ion Beam Preparation for Transmission Electron Microscopy

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 23 Aug 2015
EventMCM2015 - Eger, Ungarn
Duration: 23 Aug 201528 Aug 2015

Conference

ConferenceMCM2015
CityEger, Ungarn
Period23/08/1528/08/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Focused Ion Beam Preparation for Transmission Electron Microscopy. / Dienstleder, Martina; Gspan, Christian; Kothleitner, Gerald; Hofer, Ferdinand.

2015. MCM2015, Eger, Ungarn, .

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

@conference{e4c1564dc917447aad6379d786d7b2fa,
title = "Focused Ion Beam Preparation for Transmission Electron Microscopy",
author = "Martina Dienstleder and Christian Gspan and Gerald Kothleitner and Ferdinand Hofer",
year = "2015",
month = "8",
day = "23",
language = "English",
note = "MCM2015 ; Conference date: 23-08-2015 Through 28-08-2015",

}

TY - CONF

T1 - Focused Ion Beam Preparation for Transmission Electron Microscopy

AU - Dienstleder, Martina

AU - Gspan, Christian

AU - Kothleitner, Gerald

AU - Hofer, Ferdinand

PY - 2015/8/23

Y1 - 2015/8/23

M3 - (Old data) Lecture or Presentation

ER -