Focused Ion Beam Preparation for Transmission Electron Microscopy

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMultinational Congress on Microscopy
Publisher.
PagesO-135-101-103
Publication statusPublished - 2015
EventMultinational Congress on Microscopy - Eger, Hungary
Duration: 23 Aug 201528 Aug 2015

Conference

ConferenceMultinational Congress on Microscopy
CountryHungary
CityEger
Period23/08/1528/08/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Dienstleder, M., Gspan, C., Kothleitner, G., & Hofer, F. (2015). Focused Ion Beam Preparation for Transmission Electron Microscopy. In Multinational Congress on Microscopy (pp. O-135-101-103). ..