Focused Ion Beam Preparation for Transmission Electron Microscopy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationMultinational Congress on Microscopy
Publisher.
PagesO-135-101-103
Publication statusPublished - 2015
EventMultinational Congress on Microscopy - Eger, Hungary
Duration: 23 Aug 201528 Aug 2015

Conference

ConferenceMultinational Congress on Microscopy
CountryHungary
CityEger
Period23/08/1528/08/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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