Focused Electron Beam‐Based 3D Nanoprinting for Scanning Probe Microscopy: A Review

Harald Plank, Robert Winkler, C.H. Schwalb, Johanna Hütner, Jason D. Fowlkes, P. Rack, Ivo Utke, Michael Huth

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
JournalMicromachines
Volume2020
Issue number11, 48
DOIs
Publication statusPublished - 2020

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Focused Electron Beam‐Based 3D Nanoprinting for Scanning Probe Microscopy: A Review. / Plank, Harald; Winkler, Robert; Schwalb, C.H.; Hütner, Johanna ; Fowlkes, Jason D.; Rack, P.; Utke, Ivo; Huth, Michael.

In: Micromachines, Vol. 2020, No. 11, 48, 2020.

Research output: Contribution to journalArticleResearchpeer-review

Plank, Harald ; Winkler, Robert ; Schwalb, C.H. ; Hütner, Johanna ; Fowlkes, Jason D. ; Rack, P. ; Utke, Ivo ; Huth, Michael. / Focused Electron Beam‐Based 3D Nanoprinting for Scanning Probe Microscopy: A Review. In: Micromachines. 2020 ; Vol. 2020, No. 11, 48.
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AU - Fowlkes, Jason D.

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