FITness Assessment - Hardware Algorithm Safety Validation

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Error correction codes (ECC) are important safety methods for digital data to gain control of single event upsets (SEU) in integrated digital circuits. SEU are responsible for single bit flips inside a digital circuit caused by ionizing radiation. This effect does not affect the physical structure of the components but the correctness of data inside flip flops. Consequently, data gets corrupted and the correct program flow gets disturbed. This effect needs to be considered especially for safety-critical systems. In the novel ISO 26262 2nd Edition, the automotive domain suggests controlling SEU effects by algorithms that correct single bit errors and detect double bit errors (SEC-DED). This raises the question what kind of impact double bit error correction (DEC) will have on the overall safety level for LiDAR systems. In this paper we determine the difference between two ECC algorithms from a safety point of view: Hamming's code (SEC-DED) and BCH-code (DEC). For this purpose we developed a novel method for algorithm safety validation and applied it to both algorithms.
Original languageEnglish
Title of host publicationPerformance, Safety and Robustness in Complex Systems and Applications
Subtitle of host publicationProceedings of a meeting held 24-28 March 2019, Valencia, Spain. Held at NexComm 2019
EditorsM. R. Nejad
PublisherIARIA
Pages12-17
Number of pages6
ISBN (Print)9781510883734
Publication statusPublished - 24 Mar 2019
EventThe Ninth International Conference on Performance, Safety and Robustness in Complex Systems and Applications - Valencia, Spain
Duration: 24 Mar 201928 Mar 2019

Conference

ConferenceThe Ninth International Conference on Performance, Safety and Robustness in Complex Systems and Applications
Abbreviated titlePESARO 2019
CountrySpain
CityValencia
Period24/03/1928/03/19

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