First Applications of Electron Energy-Loss Spectroscopy with High Energy Resolution

Gerald Kothleitner; Christoph Mitterbauer; Werner Grogger; Ferdinand Hofer; H. Zandbergen; P. Tiemeijer; B. Freitag; M. Barfels

First Applications of Electron Energy-Loss Spectroscopy with High Energy Resolution

Gerald Kothleitner, Christoph Mitterbauer, Werner Grogger, Ferdinand Hofer, H. Zandbergen, P. Tiemeijer, B. Freitag, M. Barfels

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Mat. Res. Soc. Symp. Proc. Vol. 738,
Publisher	.
Publication status	Submitted - 2003

2 Finished

Near-Edge Fine Structures in EELS
Kothleitner, G., Grogger, W., Hofer, F., Wewerka, K., Letofsky-Papst, I. & Mitterbauer, C.
1/02/00 → 31/12/05
Project: Research area
Analytical Electron Microscopy
Schaffer, B., Hofer, F., Rogers, M., Mitterbauer, C. & Wewerka, K.
1/01/95 → 31/01/03
Project: Research area

Cite this

@inproceedings{79d88fd1d81e4bfb9d70270e543e14f0,

title = "First Applications of Electron Energy-Loss Spectroscopy with High Energy Resolution",

author = "Gerald Kothleitner and Christoph Mitterbauer and Werner Grogger and Ferdinand Hofer and H. Zandbergen and P. Tiemeijer and B. Freitag and M. Barfels",

note = ", Seite von - bis: 27-32.",

year = "2003",

language = "English",

booktitle = "Mat. Res. Soc. Symp. Proc. Vol. 738,",

publisher = ".",

}

TY - GEN

T1 - First Applications of Electron Energy-Loss Spectroscopy with High Energy Resolution

AU - Kothleitner, Gerald

AU - Mitterbauer, Christoph

AU - Grogger, Werner

AU - Hofer, Ferdinand

AU - Zandbergen, H.

AU - Tiemeijer, P.

AU - Freitag, B.

AU - Barfels, M.

N1 - , Seite von - bis: 27-32.

PY - 2003

Y1 - 2003

M3 - Conference paper

BT - Mat. Res. Soc. Symp. Proc. Vol. 738,

PB - .

ER -

First Applications of Electron Energy-Loss Spectroscopy with High Energy Resolution

Projects

Near-Edge Fine Structures in EELS

Analytical Electron Microscopy

Cite this