Finite element analysis of cable shields to investigate the behavior of the transfer impedance with respect to fast transients

Susanne Bauer, Christian Türk, Werner Renhart, Oszkár Bíró

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Investigation of electrical fast transients and their influence on signal integrity in shielded cables is an important topic in the field of electromagnetic compatibility (EMC). Signal integrity problems can occur on the basis of coupled disturbances on the transmitting cable in form of fast transients caused by some electromagnetic interference (EMI) current in the shield together with the transfer impedance. The aim of this paper is to develop an applicable model to calculate and estimate the behavior of cable shields and their transfer impedance over a wide frequency spectrum and under the direct influence of fast transient phenomena.

Original languageEnglish
Title of host publication2019 IEEE 23rd Workshop on Signal and Power Integrity, SPI 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9781538683422
DOIs
Publication statusPublished - 1 Jun 2019
Event23rd IEEE Workshop on Signal and Power Integrity, SPI 2019 - Chambery, France
Duration: 18 Jun 201921 Jun 2019

Publication series

Name2019 IEEE 23rd Workshop on Signal and Power Integrity, SPI 2019 - Proceedings

Conference

Conference23rd IEEE Workshop on Signal and Power Integrity, SPI 2019
CountryFrance
CityChambery
Period18/06/1921/06/19

Keywords

  • electromagnetic compatibility
  • fast transients
  • finite element method (FEM)
  • shielded cable
  • transfer impedance

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Signal Processing
  • Electrical and Electronic Engineering
  • Instrumentation

Fingerprint Dive into the research topics of 'Finite element analysis of cable shields to investigate the behavior of the transfer impedance with respect to fast transients'. Together they form a unique fingerprint.

Cite this