Field injection probes for field coupled electrostatic discharge sensitivity database of ICs

Zhen Li; Jiang Xiao; Byongsu Seol; Jongsung Lee; David Pommerenke

doi:10.1109/ISEMC.2010.5711295

Field injection probes for field coupled electrostatic discharge sensitivity database of ICs

Zhen Li^*, Jiang Xiao, Byongsu Seol, Jongsung Lee, David Pommerenke

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

An ESD (Electrostatic Discharge) sensitivity database gives a guidance in estimating if, for a given ESD scenario and IC location soft-error (e.g., resets) problems are likely to occur or not. This paper reports on the field probes used.

Original language	English
Title of host publication	IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program
Pages	329-333
Number of pages	5
DOIs	https://doi.org/10.1109/ISEMC.2010.5711295
Publication status	Published - 1 Dec 2010
Externally published	Yes
Event	2010 IEEE International Symposium on Electromagnetic Compatibility: EMC 2010 - Fort Lauderdale, United States Duration: 25 Jul 2010 → 30 Jul 2010

Publication series

Name	IEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)	1077-4076

Conference

Conference	2010 IEEE International Symposium on Electromagnetic Compatibility
Country/Territory	United States
City	Fort Lauderdale
Period	25/07/10 → 30/07/10

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/ISEMC.2010.5711295

Cite this

Li, Z., Xiao, J., Seol, B., Lee, J., & Pommerenke, D. (2010). Field injection probes for field coupled electrostatic discharge sensitivity database of ICs. In IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program (pp. 329-333). Article 5711295 (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2010.5711295

Field injection probes for field coupled electrostatic discharge sensitivity database of ICs. / Li, Zhen; Xiao, Jiang; Seol, Byongsu et al.
IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program. 2010. p. 329-333 5711295 (IEEE International Symposium on Electromagnetic Compatibility).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Li, Z, Xiao, J, Seol, B, Lee, J & Pommerenke, D 2010, Field injection probes for field coupled electrostatic discharge sensitivity database of ICs. in IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program., 5711295, IEEE International Symposium on Electromagnetic Compatibility, pp. 329-333, 2010 IEEE International Symposium on Electromagnetic Compatibility, Fort Lauderdale, Florida, United States, 25/07/10. https://doi.org/10.1109/ISEMC.2010.5711295

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abstract = "An ESD (Electrostatic Discharge) sensitivity database gives a guidance in estimating if, for a given ESD scenario and IC location soft-error (e.g., resets) problems are likely to occur or not. This paper reports on the field probes used.",

author = "Zhen Li and Jiang Xiao and Byongsu Seol and Jongsung Lee and David Pommerenke",

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doi = "10.1109/ISEMC.2010.5711295",

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Field injection probes for field coupled electrostatic discharge sensitivity database of ICs

Abstract

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