Field extraction from near field scanning for a microstrip structure

Lin Zhang, Kevin P. Slattery, Chen Wang, Masahiro Yamaguchi, Ken Ichi Arai, Richard E. DuBroff, James L. Drewniak, David Pommerenke, Todd Hubing

Research output: Contribution to journalArticle

Abstract

Currents associated with high-speed digital device have significant impacts on EMI problems in VLSI design and operation. In this paper, a simple transmission line model was implemented as an initial step to represent the EMI mechanisms associated with an IC package. Numerical modeling results were compared with near field scanning measurements and show that the magnetic field deduced from the measurements agrees well with the numerical predictions.

Original languageEnglish
Article number4
Pages (from-to)589-592
Number of pages4
JournalIEEE International Symposium on Electromagnetic Compatibility
Volume2
DOIs
Publication statusPublished - 1 Jan 2002
Externally publishedYes

Keywords

  • Microstrip
  • Near field scanning
  • Numerical modeling

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Zhang, L., Slattery, K. P., Wang, C., Yamaguchi, M., Arai, K. I., DuBroff, R. E., ... Hubing, T. (2002). Field extraction from near field scanning for a microstrip structure. IEEE International Symposium on Electromagnetic Compatibility, 2, 589-592. [4]. https://doi.org/10.1109/ISEMC.2002.1032657