FEM-Based Computation of Circuit Parameters for Testing Fast Transients for EMC Problems

Susanne Bauer*, Werner Renhart, Oszkár Bíró

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

To test the immunity of an electronic devices against electrical fast transient pulses, the standardized electromagnetic compatibility measurement setup of the capacitive coupling clamp has been utilized. This paper outlines the extraction of circuit parameters with finite elements for this standardized setup. The obtained circuit parameters can be used for time saving simulations with quite common circuit simulators like LTSPICE. The simulated results are in good agreement with the measured output.

Original languageEnglish
Article number7812785
JournalIEEE Transactions on Magnetics
Volume53
Issue number6
DOIs
Publication statusPublished - 1 Jun 2017

Keywords

  • Eddy currents
  • electromagnetic compatibility (EMC)
  • electrostatics
  • FEM

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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