FDive: Learning Relevance Models using Pattern-based Similarity Measures

F. Dennig, T. Polk, Z. Lin, T. Schreck, H.-P. Pfister, M. Behrisch

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProc. IEEE VAST
Number of pages12
Publication statusPublished - 2019

Fields of Expertise

  • Information, Communication & Computing

Cite this

Dennig, F., Polk, T., Lin, Z., Schreck, T., Pfister, H-P., & Behrisch, M. (2019). FDive: Learning Relevance Models using Pattern-based Similarity Measures. In Proc. IEEE VAST