FDive: Learning Relevance Models using Pattern-based Similarity Measures

F. Dennig, T. Polk, Z. Lin, T. Schreck, H.-P. Pfister, M. Behrisch

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProc. IEEE VAST
Number of pages12
Publication statusPublished - 2019

Fields of Expertise

  • Information, Communication & Computing

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