Abstract
In this paper the robustness of smart power ICs to electromagnetic interferences (EMI) coupled into their supply and output pins will be shown. In particular, the susceptibility of the integrated protection and diagnosis functionality will be investigated. It will be shown to what extent such devices can correctly detect fault conditions to ensure functional safety, robustness and reliability tasks, if electromagnetic interferences are coupled into their pins.
Original language | English |
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Title of host publication | 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 44-49 |
Number of pages | 6 |
ISBN (Electronic) | 9781509059973 |
DOIs | |
Publication status | Published - 2018 |
Event | 60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 - Suntec City, Singapore Duration: 14 May 2018 → 18 May 2018 |
Conference
Conference | 60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 |
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Country/Territory | Singapore |
City | Suntec City |
Period | 14/05/18 → 18/05/18 |
Keywords
- Direct power injection
- Electromagnetic compatibility
- Electromagnetic interference
- Functional safety
- IEC 62132
- ISO 26262
- Smart power device
ASJC Scopus subject areas
- Aerospace Engineering
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
- Radiation
Fields of Expertise
- Information, Communication & Computing