Fault Localization in the Light of Faulty User Input

Birgit Gertraud Hofer, Franz Wotawa

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageGerman
Title of host publicationProceedings of the IEEE International Conference on Software Quality, Reliability and Security (QRS'15)
Publisher.
Pages282-291
ISBN (Print)978-1-4673-7989-2
DOIs
Publication statusPublished - 2015
EventInternational Conference on Software Quality, Reliability and Security - Vancouver, Canada
Duration: 3 Aug 20155 Aug 2015

Conference

ConferenceInternational Conference on Software Quality, Reliability and Security
CountryCanada
CityVancouver
Period3/08/155/08/15

Fields of Expertise

  • Information, Communication & Computing

Cite this

Hofer, B. G., & Wotawa, F. (2015). Fault Localization in the Light of Faulty User Input. In Proceedings of the IEEE International Conference on Software Quality, Reliability and Security (QRS'15) (pp. 282-291). .. https://doi.org/10.1109/QRS.2015.47

Fault Localization in the Light of Faulty User Input. / Hofer, Birgit Gertraud; Wotawa, Franz.

Proceedings of the IEEE International Conference on Software Quality, Reliability and Security (QRS'15). ., 2015. p. 282-291.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Hofer, BG & Wotawa, F 2015, Fault Localization in the Light of Faulty User Input. in Proceedings of the IEEE International Conference on Software Quality, Reliability and Security (QRS'15). ., pp. 282-291, International Conference on Software Quality, Reliability and Security, Vancouver, Canada, 3/08/15. https://doi.org/10.1109/QRS.2015.47
Hofer BG, Wotawa F. Fault Localization in the Light of Faulty User Input. In Proceedings of the IEEE International Conference on Software Quality, Reliability and Security (QRS'15). . 2015. p. 282-291 https://doi.org/10.1109/QRS.2015.47
Hofer, Birgit Gertraud ; Wotawa, Franz. / Fault Localization in the Light of Faulty User Input. Proceedings of the IEEE International Conference on Software Quality, Reliability and Security (QRS'15). ., 2015. pp. 282-291
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