Fault-based Test Case Generation for Component Connectors

Bernhard Aichernig, Farhad Arbab, Lacramioara Astefanoaei, Frank S. de Boer, Meng Sun, Jan Rutten

Research output: Chapter in Book/Report/Conference proceedingConference paper

Original languageEnglish
Title of host publicationIEEE International Symposium on Theoretical Aspects of Software Engineering
PublisherIEEE Computer Society
Pages147-154
Publication statusPublished - 2009
EventIEEE International Symposium on Theoretical Aspects of Software Engineering - Tianjin, China
Duration: 29 Jul 200931 Jul 2009

Conference

ConferenceIEEE International Symposium on Theoretical Aspects of Software Engineering
CountryChina
CityTianjin
Period29/07/0931/07/09

Treatment code (Nähere Zuordnung)

  • Theoretical

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