Fault-based Test Case Generation for Component Connectors

Bernhard Aichernig, Farhad Arbab, Lacramioara Astefanoaei, Frank S. de Boer, Meng Sun, Jan Rutten

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationIEEE International Symposium on Theoretical Aspects of Software Engineering
PublisherIEEE Computer Society
Pages147-154
Publication statusPublished - 2009
EventIEEE International Symposium on Theoretical Aspects of Software Engineering - Tianjin, China
Duration: 29 Jul 200931 Jul 2009

Conference

ConferenceIEEE International Symposium on Theoretical Aspects of Software Engineering
CountryChina
CityTianjin
Period29/07/0931/07/09

Treatment code (Nähere Zuordnung)

  • Theoretical

Cite this

Aichernig, B., Arbab, F., Astefanoaei, L., de Boer, F. S., Sun, M., & Rutten, J. (2009). Fault-based Test Case Generation for Component Connectors. In IEEE International Symposium on Theoretical Aspects of Software Engineering (pp. 147-154). IEEE Computer Society.

Fault-based Test Case Generation for Component Connectors. / Aichernig, Bernhard; Arbab, Farhad; Astefanoaei, Lacramioara; de Boer, Frank S.; Sun, Meng; Rutten, Jan.

IEEE International Symposium on Theoretical Aspects of Software Engineering. IEEE Computer Society, 2009. p. 147-154.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Aichernig, B, Arbab, F, Astefanoaei, L, de Boer, FS, Sun, M & Rutten, J 2009, Fault-based Test Case Generation for Component Connectors. in IEEE International Symposium on Theoretical Aspects of Software Engineering. IEEE Computer Society, pp. 147-154, IEEE International Symposium on Theoretical Aspects of Software Engineering, Tianjin, China, 29/07/09.
Aichernig B, Arbab F, Astefanoaei L, de Boer FS, Sun M, Rutten J. Fault-based Test Case Generation for Component Connectors. In IEEE International Symposium on Theoretical Aspects of Software Engineering. IEEE Computer Society. 2009. p. 147-154
Aichernig, Bernhard ; Arbab, Farhad ; Astefanoaei, Lacramioara ; de Boer, Frank S. ; Sun, Meng ; Rutten, Jan. / Fault-based Test Case Generation for Component Connectors. IEEE International Symposium on Theoretical Aspects of Software Engineering. IEEE Computer Society, 2009. pp. 147-154
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AU - Rutten, Jan

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