Fault-based Test Case Generation for Component Connectors

Bernhard Aichernig, Farhad Arbab, Lacramioara Astefanoaei, Frank S. de Boer, Meng Sun, Jan Rutten

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationIEEE International Symposium on Theoretical Aspects of Software Engineering
PublisherIEEE Computer Society
Pages147-154
Publication statusPublished - 2009
EventIEEE International Symposium on Theoretical Aspects of Software Engineering - Tianjin, China
Duration: 29 Jul 200931 Jul 2009

Conference

ConferenceIEEE International Symposium on Theoretical Aspects of Software Engineering
CountryChina
CityTianjin
Period29/07/0931/07/09

Treatment code (Nähere Zuordnung)

  • Theoretical

Projects

Formal Methods

Lucas, P., Lorber, F. L., Jöbstl, E. & Aichernig, B.

1/01/95 → …

Project: Research area

Cite this

Aichernig, B., Arbab, F., Astefanoaei, L., de Boer, F. S., Sun, M., & Rutten, J. (2009). Fault-based Test Case Generation for Component Connectors. In IEEE International Symposium on Theoretical Aspects of Software Engineering (pp. 147-154). IEEE Computer Society.