Fault-based Test Case Generation for Component Connectors

Bernhard Aichernig, Farhad Arbab, Lacramioara Astefanoaei, Frank S. de Boer, Meng Sun, Jan Rutten

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	IEEE International Symposium on Theoretical Aspects of Software Engineering
Publisher	IEEE Computer Society
Pages	147-154
Publication status	Published - 2009
Event	IEEE International Symposium on Theoretical Aspects of Software Engineering - Tianjin, China Duration: 29 Jul 2009 → 31 Jul 2009

Conference	IEEE International Symposium on Theoretical Aspects of Software Engineering
Country/Territory	China
City	Tianjin
Period	29/07/09 → 31/07/09

Treatment code (Nähere Zuordnung)

Formal Methods
Lucas, P., Lorber, F. L., Jöbstl, E. & Aichernig, B.
1/01/95 → …
Project: Research area

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title = "Fault-based Test Case Generation for Component Connectors",

author = "Bernhard Aichernig and Farhad Arbab and Lacramioara Astefanoaei and {de Boer}, {Frank S.} and Meng Sun and Jan Rutten",

year = "2009",

language = "English",

pages = "147--154",

booktitle = "IEEE International Symposium on Theoretical Aspects of Software Engineering",

publisher = "IEEE Computer Society",

address = "United States",

note = "IEEE International Symposium on Theoretical Aspects of Software Engineering ; Conference date: 29-07-2009 Through 31-07-2009",

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TY - GEN

T1 - Fault-based Test Case Generation for Component Connectors

AU - Aichernig, Bernhard

AU - Arbab, Farhad

AU - Astefanoaei, Lacramioara

AU - de Boer, Frank S.

AU - Sun, Meng

AU - Rutten, Jan

PY - 2009

Y1 - 2009

M3 - Conference paper

SP - 147

EP - 154

BT - IEEE International Symposium on Theoretical Aspects of Software Engineering

PB - IEEE Computer Society

T2 - IEEE International Symposium on Theoretical Aspects of Software Engineering

Y2 - 29 July 2009 through 31 July 2009

ER -