Fast automated 3D EDXS Mapping

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInstrumentation and Methodology
Place of PublicationWien
PublisherFacultas
Pages81-82
ISBN (Print)978-3-85125-062-6
DOIs
Publication statusPublished - 2009
EventMultinational Congress on Microscopy - Graz, Austria
Duration: 30 Aug 20094 Sep 2009

Conference

ConferenceMultinational Congress on Microscopy
CountryAustria
CityGraz
Period30/08/094/09/09

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Fast automated 3D EDXS Mapping. / Wagner, Julian; Mitsche, Stefan; Letofsky-Papst, Ilse; Schröttner, Hartmuth; Sommitsch, Christof.

Instrumentation and Methodology. Wien : Facultas, 2009. p. 81-82.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Wagner, J, Mitsche, S, Letofsky-Papst, I, Schröttner, H & Sommitsch, C 2009, Fast automated 3D EDXS Mapping. in Instrumentation and Methodology. Facultas, Wien, pp. 81-82, Multinational Congress on Microscopy, Graz, Austria, 30/08/09. https://doi.org/10.3217/978-3-85125-062-6-039
Wagner, Julian ; Mitsche, Stefan ; Letofsky-Papst, Ilse ; Schröttner, Hartmuth ; Sommitsch, Christof. / Fast automated 3D EDXS Mapping. Instrumentation and Methodology. Wien : Facultas, 2009. pp. 81-82
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