Original language | English |
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Title of host publication | Instrumentation and Methodology |
Place of Publication | Wien |
Publisher | Facultas |
Pages | 81-82 |
ISBN (Print) | 978-3-85125-062-6 |
DOIs | |
Publication status | Published - 2009 |
Event | Multinational Congress on Microscopy - Graz, Austria Duration: 30 Aug 2009 → 4 Sep 2009 |
Conference
Conference | Multinational Congress on Microscopy |
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Country | Austria |
City | Graz |
Period | 30/08/09 → 4/09/09 |
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)
Cite this
Fast automated 3D EDXS Mapping. / Wagner, Julian; Mitsche, Stefan; Letofsky-Papst, Ilse; Schröttner, Hartmuth; Sommitsch, Christof.
Instrumentation and Methodology. Wien : Facultas, 2009. p. 81-82.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
}
TY - GEN
T1 - Fast automated 3D EDXS Mapping
AU - Wagner, Julian
AU - Mitsche, Stefan
AU - Letofsky-Papst, Ilse
AU - Schröttner, Hartmuth
AU - Sommitsch, Christof
PY - 2009
Y1 - 2009
U2 - 10.3217/978-3-85125-062-6-039
DO - 10.3217/978-3-85125-062-6-039
M3 - Conference contribution
SN - 978-3-85125-062-6
SP - 81
EP - 82
BT - Instrumentation and Methodology
PB - Facultas
CY - Wien
ER -