| Original language | English |
|---|---|
| Title of host publication | Instrumentation and Methodology |
| Place of Publication | Wien |
| Publisher | Facultas |
| Pages | 81-82 |
| ISBN (Print) | 978-3-85125-062-6 |
| DOIs | |
| Publication status | Published - 2009 |
| Event | Multinational Congress on Microscopy - Graz, Austria Duration: 30 Aug 2009 → 4 Sep 2009 |
Conference
| Conference | Multinational Congress on Microscopy |
|---|---|
| Country | Austria |
| City | Graz |
| Period | 30/08/09 → 4/09/09 |
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)
Cite this
Wagner, J., Mitsche, S., Letofsky-Papst, I., Schröttner, H., & Sommitsch, C. (2009). Fast automated 3D EDXS Mapping. In Instrumentation and Methodology (pp. 81-82). Wien: Facultas. https://doi.org/10.3217/978-3-85125-062-6-039
Fast automated 3D EDXS Mapping. / Wagner, Julian; Mitsche, Stefan; Letofsky-Papst, Ilse; Schröttner, Hartmuth; Sommitsch, Christof.
Instrumentation and Methodology. Wien : Facultas, 2009. p. 81-82.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Wagner, J, Mitsche, S, Letofsky-Papst, I, Schröttner, H & Sommitsch, C 2009, Fast automated 3D EDXS Mapping. in Instrumentation and Methodology. Facultas, Wien, pp. 81-82, Multinational Congress on Microscopy, Graz, Austria, 30/08/09. https://doi.org/10.3217/978-3-85125-062-6-039
Wagner J, Mitsche S, Letofsky-Papst I, Schröttner H, Sommitsch C. Fast automated 3D EDXS Mapping. In Instrumentation and Methodology. Wien: Facultas. 2009. p. 81-82 https://doi.org/10.3217/978-3-85125-062-6-039
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title = "Fast automated 3D EDXS Mapping",
author = "Julian Wagner and Stefan Mitsche and Ilse Letofsky-Papst and Hartmuth Schr{\"o}ttner and Christof Sommitsch",
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booktitle = "Instrumentation and Methodology",
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AU - Wagner, Julian
AU - Mitsche, Stefan
AU - Letofsky-Papst, Ilse
AU - Schröttner, Hartmuth
AU - Sommitsch, Christof
PY - 2009
Y1 - 2009
U2 - 10.3217/978-3-85125-062-6-039
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M3 - Conference contribution
SN - 978-3-85125-062-6
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EP - 82
BT - Instrumentation and Methodology
PB - Facultas
CY - Wien
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