Extending analytical STEM to three dimension: Spectral EELS and EDX tomography of an Al-Si based alloy

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Original languageEnglish
Title of host publicationEuropean Workshop on Spatially-Resolved Electron Spectroscopy
Publisher.
Pages18-18
Publication statusPublished - 2014
EventEuropean Workshop on Spatially-Resolved Electron Spectroscopy & Three Country Workgroupe meeting on EELS&EFTEM - TUGraz, Austria
Duration: 23 Apr 201425 Apr 2014

Conference

ConferenceEuropean Workshop on Spatially-Resolved Electron Spectroscopy & Three Country Workgroupe meeting on EELS&EFTEM
CountryAustria
CityTUGraz
Period23/04/1425/04/14

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Extending analytical STEM to three dimension: Spectral EELS and EDX tomography of an Al-Si based alloy. / Haberfehlner, Georg; Albu, Mihaela; Orthacker, Angelina; Kothleitner, Gerald.

European Workshop on Spatially-Resolved Electron Spectroscopy. ., 2014. p. 18-18.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Haberfehlner, G, Albu, M, Orthacker, A & Kothleitner, G 2014, Extending analytical STEM to three dimension: Spectral EELS and EDX tomography of an Al-Si based alloy. in European Workshop on Spatially-Resolved Electron Spectroscopy. ., pp. 18-18, European Workshop on Spatially-Resolved Electron Spectroscopy & Three Country Workgroupe meeting on EELS&EFTEM, TUGraz, Austria, 23/04/14.
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PY - 2014

Y1 - 2014

M3 - Conference contribution

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