Expert system algorithms for identifying radiated emission problems in printed circuit boards

Hwan Shim*, Todd Hubing, T. Van Doren, R. DuBroff, J. Drewniak, D. Pommerenke, Robert Kaires

*Corresponding author for this work

Research output: Contribution to journalConference article

Abstract

Radiated emission algorithms for a printed circuit board EMC expert system are described. The expert system mimics the thinking processes that human EMC engineers would use to analyze circuit boards and make design recommendations. Working with limited information about the enclosure, cables or the exact nature of the signals, the expert system evaluates different structures on the printed circuit board looking for potentially strong radiated emission sources. Results obtained from the analysis of a sample printed circuit board are provided to demonstrate how the expert system quickly identifies problems that would otherwise be difficult to locate.

Original languageEnglish
Pages (from-to)57-62
Number of pages6
JournalIEEE International Symposium on Electromagnetic Compatibility
Volume1
Publication statusPublished - 8 Oct 2004
Externally publishedYes
Event2004 International Symposium on Electromagnetic Compatibility, EMC 2004 - Santa Clara, CA, United States
Duration: 9 Aug 200413 Aug 2004

Keywords

  • Current-driven radiation
  • EMC
  • Expert system
  • Voltage-driven radiation

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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