Experimental investigation of the ESD sensitivity of an 8-bit microcontroller

Lijun Han*, Jayong Koo, David Pommerenke, Daryl Beetner, Ross Carlton

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, the susceptibility of an 8-bit microcontroller to electrostatic discharge (ESD) and electrically fast transients was tested by injecting currents through a capacitive probe into the microcontroller package pins. The reaction of the microcontroller to discharges with different rise times and polarities were investigated by measuring the voltage on the tested pins and by observing the microcontroller's clock output. Susceptibility varied significantly when injecting to one pin compared to another. Interestingly, the clock was more sensitive to currents injected into I/O pins than into pins directly related to the clock (e.g. EXTAL). Further work is underway to explain the causes of susceptibility inside the IC.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility, EMC 2007
DOIs
Publication statusPublished - 1 Dec 2007
Externally publishedYes
EventIEEE International Symposium on Electromagnetic Compatibility, EMC 2007 - Honolulu, HI, United States
Duration: 9 Jul 200713 Jul 2007

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Conference

ConferenceIEEE International Symposium on Electromagnetic Compatibility, EMC 2007
CountryUnited States
CityHonolulu, HI
Period9/07/0713/07/07

Keywords

  • Electrostatic discharge
  • Immunity
  • Microcontroller
  • Sensitivity
  • Testing

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Han, L., Koo, J., Pommerenke, D., Beetner, D., & Carlton, R. (2007). Experimental investigation of the ESD sensitivity of an 8-bit microcontroller. In IEEE International Symposium on Electromagnetic Compatibility, EMC 2007 [4305753] (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2007.173