Experiences and Possibilities with a 200 kV Monochromated (S)TEM

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	80-81
Journal	Microscopy and Microanalysis
Volume	9
Issue number	Suppl. 3
Publication status	Published - 2003

Treatment code (Nähere Zuordnung)

Near-Edge Fine Structures in EELS
Kothleitner, G., Grogger, W., Hofer, F., Wewerka, K., Letofsky-Papst, I. & Mitterbauer, C.
1/02/00 → 31/12/05
Project: Research area
Analytical Electron Microscopy
Schaffer, B., Hofer, F., Rogers, M., Mitterbauer, C. & Wewerka, K.
1/01/95 → 31/01/03
Project: Research area

@article{78abc230e2244aa8b1aabeac4d07edb4,

title = "Experiences and Possibilities with a 200 kV Monochromated (S)TEM",

author = "Gerald Kothleitner and Ferdinand Hofer",

year = "2003",

language = "English",

volume = "9",

pages = "80--81",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Suppl. 3",

}