Ex situ and in situ characterization of patterned photoreactive thin organic surface layers using friction force microscopy

Quan Shen, Matthias Edler, Thomas Griesser, Astrid-Caroline Knall, Gregor Trimmel, Wolfgang Kern, Christian Teichert

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)590-598
JournalScanning
Volume36
DOIs
Publication statusPublished - 2014

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

Ex situ and in situ characterization of patterned photoreactive thin organic surface layers using friction force microscopy. / Shen, Quan; Edler, Matthias; Griesser, Thomas; Knall, Astrid-Caroline; Trimmel, Gregor; Kern, Wolfgang; Teichert, Christian.

In: Scanning, Vol. 36, 2014, p. 590-598.

Research output: Contribution to journalArticleResearchpeer-review

Shen, Quan ; Edler, Matthias ; Griesser, Thomas ; Knall, Astrid-Caroline ; Trimmel, Gregor ; Kern, Wolfgang ; Teichert, Christian. / Ex situ and in situ characterization of patterned photoreactive thin organic surface layers using friction force microscopy. In: Scanning. 2014 ; Vol. 36. pp. 590-598.
@article{69388c4d030c45518e5520db3e3d1b0b,
title = "Ex situ and in situ characterization of patterned photoreactive thin organic surface layers using friction force microscopy",
author = "Quan Shen and Matthias Edler and Thomas Griesser and Astrid-Caroline Knall and Gregor Trimmel and Wolfgang Kern and Christian Teichert",
year = "2014",
doi = "http://dx.doi.org/10.1002/sca.21159",
language = "English",
volume = "36",
pages = "590--598",
journal = "Scanning",
issn = "0161-0457",
publisher = "John Wiley and Sons Inc.",

}

TY - JOUR

T1 - Ex situ and in situ characterization of patterned photoreactive thin organic surface layers using friction force microscopy

AU - Shen, Quan

AU - Edler, Matthias

AU - Griesser, Thomas

AU - Knall, Astrid-Caroline

AU - Trimmel, Gregor

AU - Kern, Wolfgang

AU - Teichert, Christian

PY - 2014

Y1 - 2014

U2 - http://dx.doi.org/10.1002/sca.21159

DO - http://dx.doi.org/10.1002/sca.21159

M3 - Article

VL - 36

SP - 590

EP - 598

JO - Scanning

JF - Scanning

SN - 0161-0457

ER -