Ex situ and in situ characterization of patterned photoreactive thin organic surface layers using friction force microscopy

Quan Shen, Matthias Edler, Thomas Griesser, Astrid-Caroline Knall, Gregor Trimmel, Wolfgang Kern, Christian Teichert

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)590-598
JournalScanning
Volume36
DOIs
Publication statusPublished - 2014

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

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