Evolution of microstructure and mechanical properties of a graded TiAlON thin film investigated by cross-sectional characterization techniques

Nina Schalk*, Michael Tkadletz, Velislava L. Terziyska, Marco Deluca, Ilse Letofsky-Papst, Jozef Keckes, Christian Mitterer

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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