Evolution of microstructure and mechanical properties of a graded TiAlON thin film investigated by cross-sectional characterization techniques

Nina Schalk*, Michael Tkadletz, Velislava L. Terziyska, Marco Deluca, Ilse Letofsky-Papst, Jozef Keckes, Christian Mitterer

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Evolution of microstructure and mechanical properties of a graded TiAlON thin film investigated by cross-sectional characterization techniques'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemistry