Evaluation of experimental stress-strain dependence in thermally cycled Al thin films on Si(100)

J. Keckes, M. Hafok, E. Eiper, A. Hofer, Roland Resel, C. Eisenmenger-Sittner

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)367-371
JournalPowder diffraction
Volume19
Issue number4
DOIs
Publication statusPublished - 2004

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