Estimation of contour parameter uncertainties in permittivity imaging using MCMC sampling

Christian Schwarzl

    Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

    Original languageEnglish
    Title of host publicationSensor Array and Multichannel Signal Processing Workshop, 2008. SAM 2008. 5th IEEE
    Publisher.
    Pages446-450
    ISBN (Print)978-1-4244-2240-1
    DOIs
    Publication statusPublished - 2008
    EventSensor Array and Multichannel Signal Processing Workshop - Darmstadt, Germany
    Duration: 21 Jul 200823 Jul 2008

    Conference

    ConferenceSensor Array and Multichannel Signal Processing Workshop
    Country/TerritoryGermany
    CityDarmstadt
    Period21/07/0823/07/08

    Treatment code (Nähere Zuordnung)

    • Application
    • Experimental

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