Estimation of contour parameter uncertainties in permittivity imaging using MCMC sampling

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationSensor Array and Multichannel Signal Processing Workshop, 2008. SAM 2008. 5th IEEE
Publisher.
Pages446-450
ISBN (Print)978-1-4244-2240-1
DOIs
Publication statusPublished - 2008
EventSensor Array and Multichannel Signal Processing Workshop - Darmstadt, Germany
Duration: 21 Jul 200823 Jul 2008

Conference

ConferenceSensor Array and Multichannel Signal Processing Workshop
CountryGermany
CityDarmstadt
Period21/07/0823/07/08

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental

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