ESD immunity prediction of D flip-flop in the ISO 10605 standard using a behavioral modeling methodology

Guangyao Shen*, Sen Yang, Victor V. Khilkevich, David J. Pommerenke, Hermann L. Aichele, Dirk R. Eichel, Christoph Keller

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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