Error of Emission Measurement of ICs due to Imperfect Termination of TEM Cell

V. Müllerwiebus, Bernd Deutschmann, Frank Klotz

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInternational Symposium on Electromagnetic Compatibility
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers
Pages263-267
ISBN (Print)978-1-4244-2737-6
DOIs
Publication statusPublished - 2008
EventInternational Symposium on Electromagnetic Compatibility - Hamburg, Germany
Duration: 8 Sep 200812 Sep 2008

Conference

ConferenceInternational Symposium on Electromagnetic Compatibility
CountryGermany
CityHamburg
Period8/09/0812/09/08

Fields of Expertise

  • Sonstiges

Cite this

Müllerwiebus, V., Deutschmann, B., & Klotz, F. (2008). Error of Emission Measurement of ICs due to Imperfect Termination of TEM Cell. In International Symposium on Electromagnetic Compatibility (pp. 263-267). Piscataway, NJ: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EMCEUROPE.2008.4786890