Error of Emission Measurement of ICs due to Imperfect Termination of TEM Cell

V. Müllerwiebus, Bernd Deutschmann, Frank Klotz

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationInternational Symposium on Electromagnetic Compatibility
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers
Pages263-267
ISBN (Print)978-1-4244-2737-6
DOIs
Publication statusPublished - 2008
EventInternational Symposium on Electromagnetic Compatibility: EMC 2008 - Hamburg, Germany
Duration: 8 Sept 200812 Sept 2008

Conference

ConferenceInternational Symposium on Electromagnetic Compatibility
Country/TerritoryGermany
CityHamburg
Period8/09/0812/09/08

Fields of Expertise

  • Sonstiges

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