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Dive into the research topics of 'Erratum to: Design and theoretical comparison of input ESD devices in 180 nm CMOS with focus on low capacitance (e & i Elektrotechnik und Informationstechnik, (2018), 135, 1, (69-75), 10.1007/s00502-017-0569-0)'. Together they form a unique fingerprint.- Sort by
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