Epitaxial growth and interface roughness of PdMn/Fe bilayer structures grown by ion-beam sputtering

Ning Cheng, J. P. Ahn, Werner Grogger, Kannan Krishnan

Research output: Contribution to journalConference articleResearchpeer-review

Abstract

Different orientations of PdMn films and different stacking orders of PdMn and Fe on MgO(001) were studied. At low temperatures (T<280°C) dominated by the kinetics of growth, a-axis orientated [PdMn(100)/Fe(001)/MgO(001)] was stabilized whilst c-axis [PdMn(001)/Fe(001)/MgO(001)] were obtained at higher temperatures (T> 300°C). The inverted structures, Fe(001)/PdMn(001)/MgO(001) and Fe(001)/PdMn(100)/MgO(001), were obtained epitaxially for the first time. The magnetic exchange coupling (Hc) of these PdMn/Fe bilayers show a wide range in values: ∼ 10 Oe for annealed a-axis samples, ∼ 33 Oe for c-axis normal samples and ∼ 68 Oe for c-axis inverted samples. The interface roughness of these samples was characterized by energy-filtered transmission electron microscopy (EFTEM). The orientation relationships were confirmed by x-ray diffraction and TEM. The possible origins for the He difference in a-axis and c-axis growth samples and the normal and inverted samples are discussed.

Original languageEnglish
Pages (from-to)O3.21.1-O3.21.6
JournalMaterials Research Society Symposium Proceedings
Volume672
Publication statusPublished - 1 Dec 2001
Externally publishedYes
EventMechanisms of Surface and Microstructure Evolution in Deposited Films and Structures - San Francisco, CA, United States
Duration: 17 Apr 200120 Apr 2001

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Epitaxial growth
Ion beams
Sputtering
roughness
sputtering
Surface roughness
ion beams
Transmission electron microscopy
Exchange coupling
Diffraction
X rays
transmission electron microscopy
Temperature
x ray diffraction

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Epitaxial growth and interface roughness of PdMn/Fe bilayer structures grown by ion-beam sputtering. / Cheng, Ning; Ahn, J. P.; Grogger, Werner; Krishnan, Kannan.

In: Materials Research Society Symposium Proceedings, Vol. 672, 01.12.2001, p. O3.21.1-O3.21.6.

Research output: Contribution to journalConference articleResearchpeer-review

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AU - Ahn, J. P.

AU - Grogger, Werner

AU - Krishnan, Kannan

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N2 - Different orientations of PdMn films and different stacking orders of PdMn and Fe on MgO(001) were studied. At low temperatures (T<280°C) dominated by the kinetics of growth, a-axis orientated [PdMn(100)/Fe(001)/MgO(001)] was stabilized whilst c-axis [PdMn(001)/Fe(001)/MgO(001)] were obtained at higher temperatures (T> 300°C). The inverted structures, Fe(001)/PdMn(001)/MgO(001) and Fe(001)/PdMn(100)/MgO(001), were obtained epitaxially for the first time. The magnetic exchange coupling (Hc) of these PdMn/Fe bilayers show a wide range in values: ∼ 10 Oe for annealed a-axis samples, ∼ 33 Oe for c-axis normal samples and ∼ 68 Oe for c-axis inverted samples. The interface roughness of these samples was characterized by energy-filtered transmission electron microscopy (EFTEM). The orientation relationships were confirmed by x-ray diffraction and TEM. The possible origins for the He difference in a-axis and c-axis growth samples and the normal and inverted samples are discussed.

AB - Different orientations of PdMn films and different stacking orders of PdMn and Fe on MgO(001) were studied. At low temperatures (T<280°C) dominated by the kinetics of growth, a-axis orientated [PdMn(100)/Fe(001)/MgO(001)] was stabilized whilst c-axis [PdMn(001)/Fe(001)/MgO(001)] were obtained at higher temperatures (T> 300°C). The inverted structures, Fe(001)/PdMn(001)/MgO(001) and Fe(001)/PdMn(100)/MgO(001), were obtained epitaxially for the first time. The magnetic exchange coupling (Hc) of these PdMn/Fe bilayers show a wide range in values: ∼ 10 Oe for annealed a-axis samples, ∼ 33 Oe for c-axis normal samples and ∼ 68 Oe for c-axis inverted samples. The interface roughness of these samples was characterized by energy-filtered transmission electron microscopy (EFTEM). The orientation relationships were confirmed by x-ray diffraction and TEM. The possible origins for the He difference in a-axis and c-axis growth samples and the normal and inverted samples are discussed.

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