Enhancement of the DPI method for IC immunity characterization

Andrea Lavarda, Bernd Deutschmann, Dieter Haerle

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProc. of International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017)
Pages178-183
DOIs
Publication statusPublished - 6 Jul 2017

ASJC Scopus subject areas

  • Engineering(all)

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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