Enhancement of the DPI method for IC immunity characterization

Andrea Lavarda, Bernd Deutschmann, Dieter Haerle

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProc. of International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017)
Pages178-183
DOIs
Publication statusPublished - 6 Jul 2017

ASJC Scopus subject areas

  • Engineering(all)

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Lavarda, A., Deutschmann, B., & Haerle, D. (2017). Enhancement of the DPI method for IC immunity characterization. In Proc. of International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017) (pp. 178-183) https://doi.org/10.1109/EMCCompo.2017.7998106