Original language | English |
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Title of host publication | Proceedings of the 12th International Joint Conference on Knowledge Discovery, Knowledge Engineering and Knowledge Management, IC3K 2020, Volume 1: KDIR, Budapest, Hungary, November 2-4, 2020 |
DOIs | |
Publication status | Published - 2020 |
Enhanced Active Learning of Convolutional Neural Networks: A Case Study for Defect Classification in the Semiconductor Industry
Georgios Koutroulis*, Tiago Filipe Teixeira dos Santos, Michael Wiedemann, Christian Faistauer, Roman Kern, Stefan Thalmann
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review