Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers

Iris Hehn, Swen Schuster, Tobias Wächter, Tarek Abu-Hussein, Michael Zharnikov, Egbert Zojer*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Engineering & Materials Science

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