Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers

Iris Hehn, Swen Schuster, Tobias Wächter, Tarek Abu-Hussein, Michael Zharnikov, Egbert Zojer

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)2994
JournalThe journal of physical chemistry letters
Volume7
Publication statusPublished - 2016

ASJC Scopus subject areas

  • Chemistry(all)
  • Physics and Astronomy(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Theoretical
  • Experimental

Cooperations

  • NAWI Graz

Cite this

Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers. / Hehn, Iris; Schuster, Swen; Wächter, Tobias; Abu-Hussein, Tarek; Zharnikov, Michael; Zojer, Egbert.

In: The journal of physical chemistry letters , Vol. 7, 2016, p. 2994.

Research output: Contribution to journalArticleResearchpeer-review

Hehn, Iris ; Schuster, Swen ; Wächter, Tobias ; Abu-Hussein, Tarek ; Zharnikov, Michael ; Zojer, Egbert. / Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers. In: The journal of physical chemistry letters . 2016 ; Vol. 7. pp. 2994.
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AU - Abu-Hussein, Tarek

AU - Zharnikov, Michael

AU - Zojer, Egbert

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JO - The journal of physical chemistry letters

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