Empirical Modeling of Contact Intermodulation Effect on Coaxial Connectors

Xiong Chen, Yongning He, Ming Yu, David J. Pommerenke, Jun Fan

Research output: Contribution to journalArticlepeer-review

Abstract

An empirical modeling of contact nonlinearity-induced intermodulation (IM) effect on the coaxial connector is presented in this article. The IM weights on inner and outer conductors are clarified using the measurement method. The contact degeneration-induced IM evolution is quantized by considering the contact coupling effect between the inner and outer conductors. This article demonstrated a set of test methods to quantify the oxide-induced nonlinearity with contact degeneration effects, and these methods can evaluate the contact IM products and further predict the low IM lifetime of passive devices
Original languageEnglish
Article number8924674
Pages (from-to)5091-5099
Number of pages9
JournalIEEE Transactions on Instrumentation and Measurement
Volume69
Issue number7
DOIs
Publication statusPublished - Jul 2020

Keywords

  • Conductors
  • Contacts
  • Force
  • Connectors
  • Resistance
  • Junctions
  • Surface treatment
  • Coaxial connectors
  • contact degeneration
  • passive intermodulation (IM)
  • unstable nonlinearity

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