Abstract
For large, complex systems with multiple sources at the same frequency, localizing the sources of radiation often proves difficult. This paper presents an emission source microscopy (ESM) technique derived from synthetic aperture radar (SAR) to localize radiating sources on a PCB. Near-field scanning provides limited information about the components contributing to far-field radiation. This paper presents the source localization methodology, supported by simulation and measurement results. After localizing the sources, the far-field contribution and the total radiated power from each individual source can be estimated. The results show that the proposed method can distinguish between multiple radiating sources on a complex PCB.
Original language | English |
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Article number | 7433437 |
Pages (from-to) | 729-737 |
Number of pages | 9 |
Journal | IEEE Transactions on Electromagnetic Compatibility |
Volume | 58 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1 Jun 2016 |
Externally published | Yes |
Keywords
- Electromagnetic interference (EMI)
- emission source microscopy
- near-field scanning
- radiation sources
- source localization
- synthetic aperture radar
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering