Emission Source Microscopy Technique for EMI Source Localization

Pratik Maheshwari, Hamed Kajbaf, Victor V. Khilkevich, David Pommerenke

Research output: Contribution to journalArticle

Abstract

For large, complex systems with multiple sources at the same frequency, localizing the sources of radiation often proves difficult. This paper presents an emission source microscopy (ESM) technique derived from synthetic aperture radar (SAR) to localize radiating sources on a PCB. Near-field scanning provides limited information about the components contributing to far-field radiation. This paper presents the source localization methodology, supported by simulation and measurement results. After localizing the sources, the far-field contribution and the total radiated power from each individual source can be estimated. The results show that the proposed method can distinguish between multiple radiating sources on a complex PCB.

Original languageEnglish
Article number7433437
Pages (from-to)729-737
Number of pages9
JournalIEEE Transactions on Electromagnetic Compatibility
Volume58
Issue number3
DOIs
Publication statusPublished - 1 Jun 2016
Externally publishedYes

Keywords

  • Electromagnetic interference (EMI)
  • emission source microscopy
  • near-field scanning
  • radiation sources
  • source localization
  • synthetic aperture radar

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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