EMI-Receiver Simulation Model with Quasi-Peak Detector

Timucin David Karaca, Bernd Deutschmann, Gunter Winkler

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Computer aided design and simulations are an integral part in the development process of integrated circuits. In order to evaluate the electromagnetic compatibility (EMC) of integrated circuits in simulation, simulation models of the EMC measurement setup and the EMC measurement device are needed. In this work, an electromagnetic interference (EMI) receiver simulation model is presented. The EMI-reciever simulation model is intended to analyze electromagnetic emission (EME) of integrated circuits from transient simulations. The model is explained in detail and emulates an CISPR-16 conform test receiver. It is implemented using an STFT algorithm, and evaluates simulation output in CISPR Band-B/C/D with peak, average and quasi-peak detector. A quasi-peak detector model for pulsed disturbances is described, that significantly reduces simulation time compared to traditional implementations. The presented EMI-receiver model is verified with different test setups.
Original languageEnglish
Title of host publication 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)978-1-4799-6616-5
Publication statusPublished - 2015
EventInternational Symposium on Electromagnetic Compatibility - Dresden, Germany
Duration: 16 Aug 201522 Aug 2015


ConferenceInternational Symposium on Electromagnetic Compatibility

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Theoretical
  • Application

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  • Projects

    LEAD - LEAD-Low Emission Analog Design

    Auer, M.


    Project: Research project

    Cite this

    Karaca, T. D., Deutschmann, B., & Winkler, G. (2015). EMI-Receiver Simulation Model with Quasi-Peak Detector. In 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) (pp. 891-896). Institute of Electrical and Electronics Engineers.