EMI prediction in switched power supplies by full-wave and non-linear circuit co-simulation

Ankit Bhargava*, David Pommerenke, Keong Kam, Xin Chang, Federico Centola, Cheung Wei Lam, Robert Steinfeld

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper treats the problem of electromagnetic interference in switched mode power supplies using co-simulation. Co-simulation combines full-wave EM solution with non linear SPICE circuit. Voltages, currents (at different nodes in the circuit) that drive the EMI can be simulated. Different co-simulation strategies are discussed along with their pros and cons. Also different commercial software tools have been evaluated for this simulation technique and promising results have been compared to measurements of voltages, TEM cell coupling and coupling to an antenna. The circuit investigated is a DC-DC buck converter.

Original languageEnglish
Title of host publication2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009
Pages41-46
Number of pages6
DOIs
Publication statusPublished - 1 Dec 2009
Externally publishedYes
Event2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 - Austin, TX, United States
Duration: 17 Aug 200921 Aug 2009

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Conference

Conference2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009
CountryUnited States
CityAustin, TX
Period17/08/0921/08/09

Keywords

  • Co-simulation
  • DC/DC converter
  • Full-wave
  • SPICE

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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    Bhargava, A., Pommerenke, D., Kam, K., Chang, X., Centola, F., Lam, C. W., & Steinfeld, R. (2009). EMI prediction in switched power supplies by full-wave and non-linear circuit co-simulation. In 2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 (pp. 41-46). [5284589] (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2009.5284589