EMI-debugging of complex systems using different time, modulation, STFFT and frequency domain signal analysis techniques

Zhe Li*, David Pommerenke

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

One faces a difficult situation in EMI debugging if multiple sources radiate at the same frequency, especially, if little details on the EUT are provided. In this paper, we apply and compare a set of signal analysis techniques for identifying radiated emission sources. First, theoretical background of Joint Time-Frequency Analysis (JTFA) is given and an algorithm using Short-Term Fast Fourier Transform (STFFT) approach is applied for the data analysis. STFFT analysis provides an exclusive insight into time-dependent emission processes. Also, narrow span and zero span spectrum analysis are discussed. Special emphasis is given on signals sideband characteristics.

Original languageEnglish
Title of host publication2005 International Symposium on Electromagnetic Compatibility, EMC 2005
Pages607-611
Number of pages5
DOIs
Publication statusPublished - 1 Dec 2005
Externally publishedYes
Event2005 International Symposium on Electromagnetic Compatibility, EMC 2005 - Chicago, IL, United States
Duration: 8 Aug 200512 Aug 2005

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume2
ISSN (Print)1077-4076

Conference

Conference2005 International Symposium on Electromagnetic Compatibility, EMC 2005
CountryUnited States
CityChicago, IL
Period8/08/0512/08/05

Keywords

  • Dithered Clock
  • Fast Fourier Transform (FFT)
  • JTFA
  • Sidebands
  • STFFT
  • Zero Span

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Li, Z., & Pommerenke, D. (2005). EMI-debugging of complex systems using different time, modulation, STFFT and frequency domain signal analysis techniques. In 2005 International Symposium on Electromagnetic Compatibility, EMC 2005 (pp. 607-611). [1513586] (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2). https://doi.org/10.1109/ISEMC.2005.1513586