EMI analysis methods for synchronous buck converter EMI root cause analysis

Keong W. Kam, David Pommerenke, Lam Cheung-Wei Lam, Robert Steinfeld

Research output: Contribution to journalConference article

Abstract

DC/DC synchronous buck converters cause broadband emissions. A variety of methods are applied to analyze the root cause of the EMI. Time-domain voltage measurement and joint-Time-frequency analysis allows to determine the location of the noise source. The near field scan reveals the current paths, and impedance measurement and 3D modeling can be used for further analysis of the noise source. A dual port TEM cell allows to distinguish E from H field coupling, This paper shows the application of those methods to a synchronous buck converter and reveals the sources of EMI leading to advice on the optimal PCB design. Finally, an innovative method of using a TEM cell measurement to predict the maximum possible radiated emissions is introduced.

Original languageEnglish
Article number4652125
JournalIEEE International Symposium on Electromagnetic Compatibility
Volume2008-January
DOIs
Publication statusPublished - 1 Jan 2008
Externally publishedYes
Event2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, United States
Duration: 18 Aug 200822 Aug 2008

Keywords

  • DC/DC synchronous buck converters
  • EMI
  • TEM cell

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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