EM Leakage of RFID Devices - Comparison of Two Measurement Approaches

Thomas Korak, Thomas Plos

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	The 9th International Conference on Availability, Reliability and Security (ARES 2014)
Publisher	Institute of Electrical and Electronics Engineers
Pages	120-125
Publication status	Published - 2014
Event	9th International Conference on Availability, Security, and Reliability: ARES 2014 - Fribourg, Switzerland Duration: 8 Sept 2014 → 12 Sept 2014

Conference	9th International Conference on Availability, Security, and Reliability
Country/Territory	Switzerland
City	Fribourg
Period	8/09/14 → 12/09/14

Fields of Expertise

SeCoS - Secure Contactless Sphere - Smart RFID-Technologies for a Connected World
Bösch, W., Wenger, E., Khan, H. N., Schmidt, J., Gadringer, M. E., Spreitzer, R. C., Mendel, F., Gruss, D., Hutter, M., Freidl, P. F., Görtschacher, L. J., Mangard, S. & Grosinger, J.
1/01/13 → 31/12/15
Project: Research project
IMPA Lab
Posch, R., Rijmen, V., Posch, K., Kirschbaum, M., Schmidt, J., Schläffer, M., Szekely, A., Medwed, M., Plos, T., Peßl, P., Aigner, M. J., Wenger, E., Dominikus, S., Feldhofer, M., Hutter, M. & Oswald, M. E.
1/10/99 → 15/07/19
Project: Research area

@inproceedings{8a9bff91858c4fea9d42124478981bab,

title = "EM Leakage of RFID Devices - Comparison of Two Measurement Approaches",

author = "Thomas Korak and Thomas Plos",

year = "2014",

language = "English",

pages = "120--125",

booktitle = "The 9th International Conference on Availability, Reliability and Security (ARES 2014)",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "9th International Conference on Availability, Security, and Reliability : ARES 2014 ; Conference date: 08-09-2014 Through 12-09-2014",

}

TY - GEN

T1 - EM Leakage of RFID Devices - Comparison of Two Measurement Approaches

AU - Korak, Thomas

AU - Plos, Thomas

PY - 2014

Y1 - 2014

M3 - Conference paper

SP - 120

EP - 125

BT - The 9th International Conference on Availability, Reliability and Security (ARES 2014)

PB - Institute of Electrical and Electronics Engineers

T2 - 9th International Conference on Availability, Security, and Reliability

Y2 - 8 September 2014 through 12 September 2014

ER -