Electron microprobe analysis of(1-x)BNT-xBKT

Michael Naderer; Klaus Reichmann; Denis Schütz; Florian Mittermayr

Electron microprobe analysis of(1-x)BNT-xBKT

Michael Naderer, Klaus Reichmann, Denis Schütz, Florian Mittermayr

Research output: Contribution to conference › (Old data) Lecture or Presentation

Original language	English
Publication status	Published - 24 Jul 2011
Event	The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials - Vancouver, Canada Duration: 24 Jul 2011 → 27 Jul 2011

Conference

Conference	The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials
Country/Territory	Canada
City	Vancouver
Period	24/07/11 → 27/07/11

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)
Experimental

Cite this

Electron microprobe analysis of(1-x)BNT-xBKT. / Naderer, Michael; Reichmann, Klaus; Schütz, Denis et al.
2011. The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials, Vancouver, Canada.

Research output: Contribution to conference › (Old data) Lecture or Presentation

@conference{1e3e1e0ebd1e469785189afbb1b09124,

title = "Electron microprobe analysis of(1-x)BNT-xBKT",

author = "Michael Naderer and Klaus Reichmann and Denis Sch{\"u}tz and Florian Mittermayr",

year = "2011",

month = jul,

day = "24",

language = "English",

note = "The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials ; Conference date: 24-07-2011 Through 27-07-2011",

}

TY - CONF

T1 - Electron microprobe analysis of(1-x)BNT-xBKT

AU - Naderer, Michael

AU - Reichmann, Klaus

AU - Schütz, Denis

AU - Mittermayr, Florian

PY - 2011/7/24

Y1 - 2011/7/24

UR - http://www.sfu.ca/isaf2011/

M3 - (Old data) Lecture or Presentation

T2 - The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials

Y2 - 24 July 2011 through 27 July 2011

ER -

Electron microprobe analysis of(1-x)BNT-xBKT

Conference

Fields of Expertise

Treatment code (Nähere Zuordnung)

Other files and links

Cite this