Electron-Irradiation Damage in Chromium Nitrides and Chromium Oxynitride Thin Films

Christoph Mitterbauer, Werner Grogger, Peter Wilhartitz, Ferdinand Hofer

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to journal › Article › peer-review

1 results

Finished
Characterization of Hard Metals and Hard-Metal Layers by Means of Quantitative Energy-Filtering TEM
Hofer, F., Grogger, W., Brunegger, M., Brunegger, A. & Warbichler, P.
1/10/98 → 31/01/03
Project: Research area