Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides

Christoph Mitterbauer, Cecile Hebert, Gerald Kothleitner, Ferdinand Hofer, Peter Schattschneider, Henny W. Zandbergen

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)209-213
JournalSolid state communications
Volume130
Publication statusPublished - 2004

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides. / Mitterbauer, Christoph; Hebert, Cecile; Kothleitner, Gerald; Hofer, Ferdinand; Schattschneider, Peter; Zandbergen, Henny W.

In: Solid state communications, Vol. 130, 2004, p. 209-213.

Research output: Contribution to journalArticleResearchpeer-review

Mitterbauer, C, Hebert, C, Kothleitner, G, Hofer, F, Schattschneider, P & Zandbergen, HW 2004, 'Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides' Solid state communications, vol. 130, pp. 209-213.
Mitterbauer, Christoph ; Hebert, Cecile ; Kothleitner, Gerald ; Hofer, Ferdinand ; Schattschneider, Peter ; Zandbergen, Henny W. / Electron energy loss-near edge structure as a fingerprint for identifying chromium nitrides. In: Solid state communications. 2004 ; Vol. 130. pp. 209-213.
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AU - Mitterbauer, Christoph

AU - Hebert, Cecile

AU - Kothleitner, Gerald

AU - Hofer, Ferdinand

AU - Schattschneider, Peter

AU - Zandbergen, Henny W.

PY - 2004

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JF - Solid state communications

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