Electromagnetic Immunity: System- versus Chip-Level

Bernd Deutschmann, Gunter Winkler, Timm Ostermann, Kurt Lamedschwandner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationEMC Europe, International Symposium on Electromagnetic Compatibility / Vol. 2
Place of PublicationEindhoven
PublisherTechnische Universiteit Eindhoven
Pages843-848
ISBN (Print)90-6144-990-1
Publication statusPublished - 2004
EventInternational Symposium on Electromagnetic Compatibility - Eindhoven, Netherlands
Duration: 6 Sep 200410 Sep 2004

Conference

ConferenceInternational Symposium on Electromagnetic Compatibility
CountryNetherlands
CityEindhoven
Period6/09/0410/09/04

Fields of Expertise

  • Sonstiges

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